It is our great pleasure to invite you to the 33rd IEEE International Conference on Microelectronic Test Structure (ICMTS) which will be held April 6-9, 2020, in Edinburgh, Scotland.
ICMTS is the leading measurement and characterisation conference for micro- and nano-fabrication processes including integrated circuits, photonics, and micro- and nano-system technologies.
For advance prices please register for the conference before the 24th of February.
ICMTS 2020
South Hall Complex
The University of Edinburgh
Pollock Halls, 18 Holyrood Park Road
Edinburgh, EH16 5AR
Scotland, UK
Tutorials: April 6, 2020
Conference: April 7 - 9, 2020
Please contact the conference organisers at icmts@ed.ac.uk for more information.
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