#DATE 2020: Bridging the gap between #semiconductor technologies and architecture #design https://t.co/J8ThuGc7Rv #paper https://t.co/UJQEYSofLG

#DATE 2020: Bridging the gap between #semiconductor technologies and architecture #design https://t.co/J8ThuGc7Rv #paper pic.twitter.com/UJQEYSofLG

— Wladek Grabinski (@wladek60) February 20, 2020

from Twitter https://twitter.com/wladek60

February 20, 2020 at 03:04PM
via IFTTT

Using Python and #GNU #Octave to #plot data https://t.co/DTpsqVydDd #modeling https://t.co/x6RBT3Q6K8

Using Python and #GNU #Octave to #plot data https://t.co/DTpsqVydDd #modeling pic.twitter.com/x6RBT3Q6K8

— Wladek Grabinski (@wladek60) February 20, 2020

from Twitter https://twitter.com/wladek60

February 20, 2020 at 01:18PM
via IFTTT

#paper: Liu, X., Gao, H., Ward, J.E. et al. Power generation from ambient humidity using protein nanowires. Nature (2020). https://t.co/1aOq5zyIIT Received: 19 November 2018 Accepted: 14 November 2019 Published: 17 February 2020 https://t.co/jr8305P63a https://t.co/9nbuIRTJ4u

#paper: Liu, X., Gao, H., Ward, J.E. et al. Power generation from ambient humidity using protein nanowires. Nature (2020). https://t.co/1aOq5zyIIT
Received: 19 November 2018
Accepted: 14 November 2019
Published: 17 February 2020https://t.co/jr8305P63a pic.twitter.com/9nbuIRTJ4u

— Wladek Grabinski (@wladek60) February 19, 2020

from Twitter https://twitter.com/wladek60

February 19, 2020 at 07:36AM
via IFTTT

#paper: J. L. Wang et al., "Trap Analysis Based on Low-Frequency Noise for SiC Power MOSFETs Under Repetitive Short-Circuit Stress," in IEEE Journal of the Electron Devices Society, vol. 8, pp. 145-151, 2020. doi: 10.1109/JEDS.2020.2971245 https://t.co/hP3ZZwd29B https://t.co/N2v6Si9TVN

#paper: J. L. Wang et al., "Trap Analysis Based on Low-Frequency Noise for SiC Power MOSFETs Under Repetitive Short-Circuit Stress," in IEEE Journal of the Electron Devices Society, vol. 8, pp. 145-151, 2020.
doi: 10.1109/JEDS.2020.2971245 https://t.co/hP3ZZwd29B pic.twitter.com/N2v6Si9TVN

— Wladek Grabinski (@wladek60) February 18, 2020

from Twitter https://twitter.com/wladek60

February 18, 2020 at 02:50PM
via IFTTT

33rd IEEE ICMTS, Edinburgh, Scotland.

IEEE 33rd International Conference on Microelectronic Test Structures April 6-9, 2020, Edinburgh, Scotland

It is our great pleasure to invite you to the 33rd IEEE International Conference on Microelectronic Test Structure (ICMTS) which will be held April 6-9, 2020, in Edinburgh, Scotland.     ICMTS is the leading measurement and characterisation conference for micro- and nano-fabrication processes including integrated circuits, photonics, and micro- and nano-system technologies.   Registration for the conference is now open at the conference website: http://www.icmts.net/conf_reg    For advance prices please register for the conference before the 24th of February.     ICMTS 2020 South Hall Complex The University of Edinburgh Pollock Halls, 18 Holyrood Park Road  Edinburgh, EH16 5AR Scotland, UK   W3W: https://w3w.co/proper.marked.sums     Hotel booking information is also available:  http://www.icmts.net/hotel_reg     Tutorials: April 6, 2020 Conference: April 7 - 9, 2020   Please contact the conference organisers at icmts@ed.ac.uk for more information.   Find the ICMTS group on LinkedIn https://www.linkedin.com/groups/3804498/  Follow us on Twitter at https://twitter.com/IEEE_ICMTS