Feb 27, 2016

Electrical Characterization of FDSOI by Capacitance Measurements in Gated p-i-n Diodes https://t.co/HtDcvhqiF1 #papers #feedly #papers


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February 27, 2016 at 01:32PM
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Feb 26, 2016

An Experimental Demonstration of GaN CMOS Technology https://t.co/9Q50HGFkni #papers


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February 26, 2016 at 10:57PM
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Subthreshold Kink Effect Revisited and Optimized for Si Nanowire MOSFETs https://t.co/9Q50HGFkni #papers


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February 26, 2016 at 10:50PM
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Negative Capacitance Field Effect Transistor With Hysteresis-Free Sub-60-mV/Decade Switching https://t.co/9Q50HGFkni #papers


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February 26, 2016 at 10:37PM
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Feb 24, 2016

Keysight: Full SPICE Characterization Flow

Keysight Technologies offers half a daya seminar at IEMN, Villeneuve d’Ascq. This free seminar is an opportunity to discover "Full SPICE Characterization Flow". The content is open, based on practical industrial and academic examples to illustrate the features of Keysight CAD/EDA software tools:
  • Introduction (20 min)
  • Part 1 - Measurements Automatization (30 min)
  • Part 2 - Spice Model Extraction  (60 min)
  • Part 3 - Quality Assurance Model (20 mins)
  • Q/A Session (20 min)
Place: Grand Amphithéâtre de l’IEMN, Laboratoire Centrale, Avenue Henri Poincaré F-59491 Villeneuve d’Ascq (F)
Date 17 March 2016

[Register online]
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