#paper: A. Beckers, F. Jazaeri and C. Enz, "Inflection Phenomenon in Cryogenic MOSFET Behavior," in IEEE TED doi: 10.1109/TED.2020.2965475 https://t.co/pfaA3A4hNh pic.twitter.com/o0UnxXcu90
— Wladek Grabinski (@wladek60) February 10, 2020
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February 10, 2020 at 09:58AM
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