#paper C. Prasad, "A Review of Self-Heating Effects in Advanced CMOS Technologies," in IEEE #TED, vol. 66, no. 11, pp. 4546-4555, Nov. 2019.
— Wladek Grabinski (@wladek60) November 4, 2019
doi: 10.1109/TED.2019.2943744 https://t.co/gAh4CAmDzu pic.twitter.com/hyaCcsktDQ
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November 04, 2019 at 04:55PM
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