#paper Alam, M.N.K., Roussel, P., Heyns, M. et al. Positive non-linear capacitance: the origin of the steep subthreshold-slope in ferroelectric FETs. Sci Rep 9, 14957 (2019) doi:10.1038/s41598-019-51237-2 https://t.co/zWwduLz8pB pic.twitter.com/6pXnXiXjW8
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November 07, 2019 at 10:24AM
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