Y. Yamamoto et al., "The Study of Plasma Induced Damage on 65-nm Silicon on Thin BOX Transistor," in IEEE Journal of the Electron Devices Society, vol. 7, pp. 825-828, 2019 https://t.co/ppz92LZnNi #paper https://t.co/7hmMCY5rvx

Y. Yamamoto et al., "The Study of Plasma Induced Damage on 65-nm Silicon on Thin BOX Transistor," in IEEE Journal of the Electron Devices Society, vol. 7, pp. 825-828, 2019https://t.co/ppz92LZnNi #paper pic.twitter.com/7hmMCY5rvx

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August 27, 2019 at 11:58AM
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