F. Rasheed, M. S. Golanbari, G. Cadilha Marques, M. B. Tahoori and J. Aghassi-Hagmann, "A Smooth EKV-Based DC #Model for Accurate Simulation of Printed Transistors and Their Process Variations," in IEEE TED, vol. 65, no. 2, pp. 667-673, Feb. 2018.https://t.co/vQ0xogjSx4
— Wladek Grabinski (@wladek60) February 1, 2018
Extraction of #Process #Variation Parameters in FinFET Technology Based on #Compact #Modeling and... https://t.co/vqTFtfDxWG
— Wladek Grabinski (@wladek60) January 30, 2018
Extraction of #Process #Variation Parameters in FinFET Technology Based on #Compact #Modeling and Characterization - IEEE Journals & Magazine https://t.co/6RlUeQ3fhp
— Wladek Grabinski (@wladek60) January 30, 2018
A look inside #Facebook's #opensource program https://t.co/3NxWinj54L pic.twitter.com/9Q8ZCDCcpx
— Wladek Grabinski (@wladek60) January 29, 2018
A Method for Local Parametric Fault Diagnosis of a Broad Class of Analog Integrated Circuits https://t.co/KwosJZWeZx #paper
— Wladek Grabinski (@wladek60) January 29, 2018
