Physics-Based #Modeling of TID Induced Global Static Leakage in Different #CMOS Circuits https://t.co/OLjRR8MFge http://pic.twitter.com/xcJ8XFdkt9
— Wladek Grabinski (@wladek60) December 29, 2017
RT @Chip_Insider: Models are becoming more difficult to develop, integrate and utilize effectively at 10/7nm and beyond https://t.co/3m6l5Ce1Qp#modeling #10nm #7nm #simulation https://t.co/EEz5woRm86
— Wladek Grabinski (@wladek60) December 29, 2017
#design for #reliability of generic #sensor interface circuits https://t.co/lzvuIsruXQ #paper http://pic.twitter.com/PtL7tm0M6n
— Wladek Grabinski (@wladek60) December 27, 2017
#75Years of the #DRC- A History Worth Repeating https://t.co/ITLIEIpTDv #paper http://pic.twitter.com/nz08VI5OGg
— Wladek Grabinski (@wladek60) December 27, 2017
Charge-Based Modeling of Radiation Damage in Symmetric Double-Gate MOSFETs https://t.co/d99rQA4VTj #paper http://pic.twitter.com/Fb6sNIGpa7
— Wladek Grabinski (@wladek60) December 27, 2017
