#paper: W. E. Muhea, G. U. Castillo, H. C. Ordoñez, T. Gneiting, G. Ghibaudo and B. Iñiguez, "Parameter Extraction and Compact Modeling of 1/f Noise for Amorphous ESL IGZO TFTs," in IEEE J-EDS, vol. 8, pp. 407-412, 2020. https://t.co/SCTs7BsGJZ https://t.co/gZcCgMrYVd

#paper: W. E. Muhea, G. U. Castillo, H. C. Ordoñez, T. Gneiting, G. Ghibaudo and B. Iñiguez, "Parameter Extraction and Compact Modeling of 1/f Noise for Amorphous ESL IGZO TFTs," in IEEE J-EDS, vol. 8, pp. 407-412, 2020. https://t.co/SCTs7BsGJZ

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— Wladek Grabinski (@wladek60) April 30, 2020

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April 30, 2020 at 03:13PM
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#paper: J. Leise et al., "Charge-Based Compact Modeling of Capacitances in Staggered Multi-Finger OTFTs," in IEEE J-EDS, vol. 8, pp. 396-406, 2020. https://t.co/zk4BAp2tMj https://t.co/Ay502xHy1w

#paper: J. Leise et al., "Charge-Based Compact Modeling of Capacitances in Staggered Multi-Finger OTFTs," in IEEE J-EDS, vol. 8, pp. 396-406, 2020

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— Wladek Grabinski (@wladek60) April 30, 2020 from Twitter https://twitter.com/wladek60

#Spanish and #French governments turn to Jitsi Meet #opensource video-conferencing platform https://t.co/68ZzP2iPq2 https://t.co/uXUBtMOAli

#Spanish and #French governments turn to Jitsi Meet #opensource video-conferencing platform https://t.co/68ZzP2iPq2 pic.twitter.com/uXUBtMOAli

— Wladek Grabinski (@wladek60) April 30, 2020

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April 30, 2020 at 10:05AM
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#paper: K. Xia, "New C∞ Functions for Drain–Source Voltage Clamping in Transistor Modeling," in IEEE TED, vol. 67, no. 4, pp. 1764-1768, April 2020. https://t.co/N9yGopiPNg https://t.co/9AKubeYY5x

#paper: K. Xia, "New C∞ Functions for Drain–Source Voltage Clamping in Transistor Modeling," in IEEE TED, vol. 67, no. 4, pp. 1764-1768, April 2020.https://t.co/N9yGopiPNg pic.twitter.com/9AKubeYY5x

— Wladek Grabinski (@wladek60) April 29, 2020

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April 29, 2020 at 04:16PM
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#paper: E. A. Gutiérrez-D., J. Méndez-V., J. C. Tinoco, E. T. Rios and O. V. Huerta-G., "DC and 28 GHz Reliability of a SOI FET Technology," in IEEE J-EDS, vol. 8, pp. 385-390, 2020. https://t.co/slotpnOx43 https://t.co/sfZjtH0CPq

#paper: E. A. Gutiérrez-D., J. Méndez-V., J. C. Tinoco, E. T. Rios and O. V. Huerta-G., "DC and 28 GHz Reliability of a SOI FET Technology," in IEEE J-EDS, vol. 8, pp. 385-390, 2020. https://t.co/slotpnOx43

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— Wladek Grabinski (@wladek60) April 29, 2020
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