Jan 15, 2023

33rd IEEE MIEL 2023



We would like to inform you that 33rd IEEE International Conference on Microelectronics (MIEL 2023) will be held in Niš from October 16th-18th, 2023.
Accepted papers will be published in the Proceedings of the MIEL 2023 Conference, and included in IEEE Xplore database, subject to regular registration of at least one of the authors before August 31st, 2023.

We are pleased to invite you, as an expert in the field of microelectronics, to submit a paper to MIEL 2023 Conference and to encourage colleagues to do it. The deadline for the submission of two page-extended summaries (including figures, tables, and references) is April 28th, 2023.

Important Dates
  • December 31, 2022 First Announcement and Call for Papers
  • April 28, 2023 Deadline for Receipt of Abstracts
  • June 23, 2023 Notification on Acceptance of Papers
  • August 31, 2023 Deadline for registration
  • August 31, 2023 Deadline for Receipt of Papers
  • September 22, 2023 Dispatch of Conference Programme
Looking forward to receiving your abstract for MIEL 2023 Conference, we remain with

Best regards,

Vojkan Davidović
Danijel Danković

http://miel.elfak.ni.ac.rs/
Please contact miel@elfak.ni.ac.rs for further information.

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Jan 14, 2023

#TSMC is mulling an automotive #semi #fab in #Europe https://t.co/TDeiZXztLu https://t.co/MQ3nH0XlOR


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January 14, 2023 at 12:40AM
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Jan 12, 2023

[Paper] Time-Efficient Adaptive Procedure for Identification of Multitone X-Parameters

Konstanty Łukasik , Graduate Student Member, IEEE, Paweł Barmuta , Member, IEEE,
Troels S. Nielsen, Member, IEEE, Wojciech Wiatr , Life Member, IEEE,
and Dominique M. M.-P. Schreurs, Fellow, IEEE,
"Time-Efficient Adaptive Procedure for Identification of Multitone X-Parameters" 
in IEEE Transactions on Instrumentation and Measurement, 
vol. 72, pp. 1-9, 2023, Art no. 1000609,
DOI 10.1109/TIM.2022.3232171.

Abstract: A novel measurement procedure for the time-efficient identification of multitone X-parameters of active microwave devices and circuits is introduced. Over a given bandwidth, the procedure allows for an adaptive selection of key spectral components necessary for determining the X-parameters characteristics with a minimum measurement effort. The sequential selection is based on the divide-and-conquer algorithm. It results in a huge reduction of the measurement time in comparison to the situation when model coefficients at all spectral components are identified. To validate the procedure, an off-the-shelf broadband power amplifier (PA) was characterized under wideband large-signal excitation conditions. Moreover, small-signal terms at all relevant frequencies were collected as a reference and compared with the results provided by a time-efficient adaptive procedure (TEAP). The proposed method resulted in twenty times reduction in the number of samples required to characterize the PA. As an application example, the small-signal coefficients identified with the TEAP are used to correct characterization results for the measurement instrument’s output mismatch. The mismatch-corrected output signal of the PA under test was represented accurately with the error-vector-magnitude of only 0.132%.

FIG: Block diagram of the measurement setup used for performing experiments.



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Jan 11, 2023

[paper] Discovery of Clustered-P1 Borophene and Its Application as the Lightest High-Performance Transistor


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January 11, 2023 at 04:05PM
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Jan 10, 2023

At the outer edges of Moore’s Law


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January 10, 2023 at 03:15PM
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