Mar 5, 2020

#paper: S. Mocevic et al., "Comparison and Discussion on Shortcircuit Protections for SiC MOSFET Modules: Desaturation vs. Rogowski Switch-Current Sensor," in IEEE Transactions on Industry Applications doi: 10.1109/TIA.2020.2972816 https://t.co/qYVwtxy2BF https://t.co/Z4oY9m6Dhl


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March 05, 2020 at 03:59PM
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#paper: Q. Huo et al., "Physics-Based Device-Circuit Cooptimization Scheme for 7-nm Technology Node SRAM Design and Beyond," in IEEE Transactions on Electron Devices, vol. 67, no. 3, pp. 907-914, March 2020 doi: 10.1109/TED.2020.2964610 https://t.co/wEf5wGKzFv https://t.co/AGBu4ZUtVR


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March 05, 2020 at 03:56PM
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#DATE 2020 in Grenoble replaced by a virtual conference that will be scheduled in the coming weeks https://t.co/vwd8IZqhPo #paper https://t.co/FNMBVw2LUl


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March 05, 2020 at 03:30PM
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#EDTM 2020 Conference going Virtual -The conference will be held as a Virtual conference with all presentations be posted online. -The pre-conference Tutorials and Short Courses on March 15th, 2020 is cancelled https://t.co/x9cC8kKu6D #paper https://t.co/M8C5uO6DQY


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March 05, 2020 at 03:24PM
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Mar 4, 2020

#paper: Krishna Pradeep, Patrick Scheer, Thierry Poiroux, André Juge and Gerard Ghibaudo; In-Wafer variability in FD-SOI MOSFETs: Detailed analysis and statistical modelling" Accepted Manuscript online 27 February 2020 by IOP Publishing Ltd https://t.co/rEjVnoRLuH https://t.co/V98FnxCpeo


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March 04, 2020 at 02:51PM
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