MEMSTECH 2010

6th International Conference
Perspective Technologies and Methods in MEMS Design
Polyana, UKRAINE, 20 - 23 April 2010

Organized by:

• Lviv Polytechnic National University, CAD Department, Ukraine
• Warsaw University of Technology, Institute of Telecommunication, Poland
• IEEE MTT/ED/AP/CPMT/SSC West Ukraine Chapter

Supported by Lviv Regional State Administration

Topics include, but not limited to:

• Analysis, modelling, research and design methods of microsensors and microactuators
• Software systems, models, algorithms, methods and strategies of embedded systems design
• Field issues in embedded systems modelling and design
• Issues of testing, verification, reliability and optimization in embedded systems modelling and design
• Sensors and actuators systems, nanotechnology
• Applications for electron device design
• Information Technology. Engineering Application of Informatics. Engineering Education

Important Dates:

• February 15, 2010
• Deadline for abstract submissions (at least 400 words in plain text file, in English)
• March 15, 2010
• Notification of abstract acceptance
• April 02, 2010
• Deadline for final Camera-Ready Papers submissions (in English)

Read more...

A paper in Thin Solid Films

I've found a paper that may interest you:

The quantum size effects on the surface potential of nano-crystalline silicon thin film transistors

Ling-Feng Mao

(Available online 29 October 2009)

Abstract

The impact of the grain size of nc-Si (nano-crystalline silicon) on the surface potential of doped nc-Si TFTs (thin film transistors) is discussed. Quantum size effects cause the change in both band-gap and dielectric constant of nc-Si. Numerical calculation of the surface potential in nc-Si TFTs shows that the diameter of nc-Si has a larger effect on the surface potential of nc-Si TFTs. The results demonstrate that, for medium size (7 ~ 50 nm), the change in the band-gap of nc-Si should be considered, whereas, for small size (< 7 nm), the change in the dielectric constant of nc-Si should be considered. A simplified surface potential equation for nc-Si TFTs under strong inversion condition is proposed, and shows good agreement with the original equation via numerical calculation.


Have fun!

22nm technology projection

Papeer on 22nm technology projection at Scsong's Blog

From EDN: sales are up!

SEMI: Bookings rise y/y for first time since May 2007, industry continues to improve

North America-based manufacturers of semiconductor equipment posted $732.8 million in orders last month and an improved book-to-bill ratio of 1.17, according to SEMI's September book-to-bill report.

By Suzanne Deffree, Managing Editor, News -- Electronic News, 10/21/2009

The semiconductor industry's overall situation continued to improve in September, according to the latest data from SEMI.

North America-based manufacturers of semiconductor equipment posted $732.8 million in orders in September and a book-to-bill ratio of 1.17, according to SEMI's September book-to-bill report.

A book-to-bill of 1.17 means that $117 worth of orders were received for every $100 of product billed for the month. The August book-to-bill ratio was 1.06.

The September bookings figure is 19.3% greater than the final August level of $614.5 million and 12.8% greater than the $649.9 million in orders posted in September 2008.

Meanwhile, billings in September were $624.6 million, a 7.7% improvement on the August level of $580 million but nearly 33% less than the August 2008 billings level of $927.3 million.

And you can access the full article at the original website.

Correction on ISFE'2010

I apologize, but I made a mistake on the entry about ISFE'2010. The correct dates when the Symposium will be held are April 12-14 2010. Please take this new dates into account!