SAN DIEGO March 19-22, 2012
Day 1 | Day 2 | Day 3 |
---|---|---|
08:45 Registration | 09:00 Registration | 09:00 Registration |
08:45 Welcome | 09:00 Process Characterization | 09:00 Matching |
08:55 Design Margin | 11:10 RF | 10:50 Capacitance |
10:45 Variability | 12:10 ICMTS 2013 | 12:10 Closing |
11:45 Exhibitor Presentation | 13:50 Parameter Extraction | |
13:45 MEMS | 16:00 Stress | |
15:55 Poster |
Note: This program is subject to change without notice. Final printed version of program will be available at the conference.