Showing posts with label TCAD. Show all posts
Showing posts with label TCAD. Show all posts
Nov 14, 2024

[paper] TCAD for Circuits and Systems

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Z. Stanojevic, X. Klemenschits, G. Rzepa, F. Mitterbauer, C. Schleich, F. Schanovsky, O. Baumgartner, and M. Karner TCAD for Circuits and Sy...
Jan 29, 2024

List of the publications using or referring to DEVSIM

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List of the publications using or referring to DEVSIM [1] K. Wang et al.; Design and simulation of a novel 4H-SiC LGAD timing device; Radiat...
Jan 15, 2024

DEVSIM as TCAD mobile app

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DEVSIM : TCAD mobile app Now through January 18, 2024, the TCAD app is free for download. After this, you will be entitled to any free futur...
Oct 30, 2023

[paper] DEVSIM

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Sanchez, J. E., DEVSIM: A TCAD Semiconductor Device Simulator Journal of Open Source Software, 7(70), 3898, (2022). DOI :10.21105/joss.03898...
Jun 14, 2023

[review] TCAD Simulations of Semiconductor Piezoresistance

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Takaya Sugiura, Kazunori Matsuda*, Nobuhiko Nakano Review: Numerical Simulations of Semiconductor Piezoresistance for Computer-Aided Designs...
Jun 7, 2023

[paper] Teaching Traditional TCAD New Tricks

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Sanghoon Myung 1 , Wonik Jang 1 , Seonghoon Jin 2 Myung Choe 1 , Changwook Jeong 1 , and Dae Sin Kim 1 Restructuring TCAD System: Tea...
Mar 3, 2022

[paper] Charge Trapping/Detrapping in Scaled MOSFETs

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Ruben Asanovski, Pierpaolo Palestri*, and Luca Selmi Importance of Charge Trapping/Detrapping Involving the Gate Electrode on the Noise Curr...
Oct 20, 2021

[paper] Compact model of 3D NAND

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Kul Lee and Hyungcheol Shin Distinguishing capture cross section parameter between  in GIDL erase compact model and TCAD Japanese Journal of...
Jul 26, 2021

[paper] NCFET CMOS Logic

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Reinaldo Vega, Senior Member, IEEE, Takashi Ando*, Senior Member, IEEE,   Timothy Philip, Member, IEEE Junction Design and Complementary Cap...
Jun 29, 2021

[paper] Nano Device Simulator

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Zlatan Stanojevic , Member, IEEE , Chen-Ming Tsai, Georg Strof, Ferdinand Mitterbauer, Oskar Baumgartner, Member, IEEE , Christian Kernstock...
May 25, 2021

[papers] Aging and Device Reliability Compact Modeling

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IEEE International Reliability Physics Symposium (IRPS 2021) [1] N. Chatterjee, J. Ortega, I. Meric, P. Xiao and I. Tsameret, "Machine ...
Mar 7, 2021

[C4P] SISPAD 2021, September 27-29

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International Conference on Simulation of Semiconductor Processes and Devices SISPAD 2021, September 27-29 The abstract submission deadline ...
Mar 1, 2021

[papers] compact/SPICE modeling

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[1] M. Müller, P. Dollfus and M. Schröter, " 1-D Drift-Diffusion Simulation of Two-Valley Semiconductors and Devices ," in IEEE Tr...
Feb 26, 2021

[DAY 2] 1st Asia/South Pacific MOS-AK Workshop

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Arbeitskreis Modellierung von Systemen und Parameterextraktion Modeling of Systems and Parameter Extraction Working Group 1st Asia/South Pac...

[DAY 1] 1st Asia/South Pacific MOS-AK Workshop

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Arbeitskreis Modellierung von Systemen und Parameterextraktion Modeling of Systems and Parameter Extraction Working Group 1st Asia/South Pac...
Jan 8, 2021

[C4P] New simulation methodologies for next-generation TCAD

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Call for Papers for a Special Issue of IEEE Transactions on Electron Devices on "New simulation methodologies for next-generation TCAD...
Jan 5, 2021

[paper] NESS Open-Source TCAD Environment

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Cristina Medina-Bailon, Tapas Dutta, Fikru Adamu-Lema, Ali Rezaei, Daniel Nagy, Vihar P. Georgiev, and Asen Asenov Nano-Electronic Simulatio...
Nov 19, 2020

[paper] HEMT RF/Analog Performance

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M. Khaouani 1 ,H. Bencherif 2 , A. Hamdoune 1 , A. Belarbi 3 , Z. Kourdi 4 RF/analog Performance Assessment of High Frequency, Low Power In ...
Nov 3, 2020

Congratulations to Prof. Robert W. Dutton

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The 2020 IEEE EDS Celebrated Member and Esteemed EDS Alumni Dr. Dutton received his degrees from the University of California, Berkeley, a...
Oct 9, 2020

[paper] TCAD-Machine Learning Framework

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Hiu Yung Wong 1 (Senior Member, IEEE), Ming Xiao 2 , Boyan Wang 2 , Yan Ka Chiu 1 , Xiaodong Yan 3 , Jiahui Ma 3 , Kohei Sasaki 4 , Han Wan...