Showing posts with label characterization. Show all posts
Showing posts with label characterization. Show all posts
Oct 25, 2023

[paper] Sub-THz HICUM for SiGe HBTs

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Soumya Ranjan Panda, Thomas Zimmer, Anjan Chakravorty, Nicolas Derrier and Sebastien Fregonese Exploring Compact Modeling of SiGe HBT...
Sep 26, 2023

[paper] Characterization and Modeling of SOI LBJTs at 4K

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Yuanke Zhang, Yuefeng Chen, Yifang Zhang, Jun Xu, Chao Luo, and Guoping Guo Characterization and Modeling of Silicon-on-Insulator  Lateral B...
Nov 22, 2021

[paper] ACM Model for CMOS Analog Circuits Hand Design

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Ademirde Jesus Costa ab , Eliyas Mehdipour b , Edson PintoSantana b , and Ana Isabela Araújo Cunha b Application of Improved ACM Model to ...
Aug 21, 2021

[book] Fully Depleted SOI

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Sorin Cristoloveanu; Fully Depleted Silicon-On-Insulator: Nanodevices, Mechanisms and Characterization 2021 Elsevier B.V.  ISBN : 978-0-12-8...
Jun 28, 2021

[paper] RTN and BTI statistical compact modeling

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G.Pedreira a , J.Martin-Martinez a , P.Saraza-Canflanca b , R.Castro Lopez b , R.Rodriguez a , E.Roca b , F.V.Fernandez b , M.Nafria a   Uni...
Jun 2, 2021

[paper] Effect of the AC-Signal Frequency on Flat-Band Voltage of Al/HfO2/SiO2/Si Structures

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Andrzej Mazurak, Bogdan Majkusiak Investigation of the Anomalous Effect of the AC-Signal Frequency  on Flat-Band Voltage of Al/HfO2/SiO2/Si ...
Apr 13, 2021

[papers] Compact Modeling

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[1] Zhang, Yuanke, Tengteng Lu, Wenjie Wang, Yujing Zhang, Jun Xu, Chao Luo, and Guoping Guo. "Characterization and Modeling of Native ...
Nov 20, 2020

[paper] Characterization of ultrathin FDSOI devices using subthreshold slope method

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Teimuraz Mchedlidze 1 , and Elke Erben 2 Characterization of ultrathin FDSOI devices using subthreshold slope method Phys. Status Solidi A. ...
Oct 15, 2020

[webinar] GaN HEMT Devices Characterization Using ASM-HEMT Model

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ASM-HEMTモデルを使ったGaN HEMTデバイスの特性評価とモデリング お知らせ: キーサイト・テクノロジーのウェブセミナー「ASM-HEMTモデルを使ったGaN HEMTデバイスの特性評価とモデリング 」 ライブウェブセミナーの日付: 2020年10月14日 ライブ...
Aug 31, 2020

[paper] Bulk CMOS Technology at Sub-Kelvin Temperature

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Characterization and Modeling of 0.18µm Bulk CMOS Technology  at Sub-Kelvin Temperature  Teng-Teng Lu 1,2 , Zhen Li 1,2 , Chao Luo 1,2 , Jun...
Jul 20, 2020

[C4P] Advanced FETs: Design, Fabrication and Applications

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Call for Papers: Special MDPI  Issue  "Advanced Field Effect Transistors: Design, Fabrication and Applications" Deadline fo...
Sep 27, 2018

[paper] Importance of complete characterization setup on onwafer TRL calibration in sub-THz range

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Chandan Yadav, Marina Deng, Magali De Matos, Sebastien Fregonese and  Thomas Zimmer IMS Laboratory, University of Bordeaux 351 cours ...
Oct 17, 2017

[paper] Accurate diode behavioral model with reverse recovery

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Stanislav Banáš a,b , Jan Divína b , Josef Dobeš b , Václav Paňko a a ON Semiconductor, SCG Czech Design Center, Department of Design Sys...
Feb 24, 2016

Keysight: Full SPICE Characterization Flow

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Keysight Technologies offers half a daya seminar at IEMN, Villeneuve d’Ascq. This free seminar is an opportunity to discover "Full SPI...
May 1, 2013

13th HICUM Workshop 2013

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HICUM Workshop at TU-Delft, May 27-28, 2013 The HI gh CU rrent M odel (HICUM) has become an industry standard and one of the most suitab...