Showing posts with label
traps
.
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Showing posts with label
traps
.
Show all posts
Mar 3, 2022
[paper] Charge Trapping/Detrapping in Scaled MOSFETs
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Ruben Asanovski, Pierpaolo Palestri*, and Luca Selmi Importance of Charge Trapping/Detrapping Involving the Gate Electrode on the Noise Curr...
Mar 24, 2017
[paper] Pulsed I-V on TFETs: Modeling and Measurements
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Pulsed I-V on TFETs: Modeling and Measurements Quentin Smets, Anne Verhulst, Ji-Hong Kim, Jason P. Campbell, David Nminibapiel, Dmitry Vek...
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