Showing posts with label mosfet. Show all posts
Showing posts with label mosfet. Show all posts
May 24, 2024

[book] Advanced Nanoscale MOSFET Architectures

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Advanced Nanoscale MOSFET Architectures: Current Trends and Future Perspectives Kalyan Biswas, Angsuman Sarkar John Wiley & Sons -...

[paper] Rapid MOSFET Threshold Voltage Testing

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Michael H. Herman; Trenton T. Nguyen; Ken Wong; Jeff Johnson; Ben Morris Rapid MOSFET Threshold Voltage Testing for High Throughput Semic...
Apr 16, 2024

[paper] SiC Power MOSFET SPICE modelling

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Akbar Ghulam Accurate & Complete behaviourial SPICE modelling  of commercial SiC Power MOSFET OF 1200V, 75A 25th EuroSimE, Catania, Ital...
Apr 3, 2024

[paper] CMOS Technology for Analog Applications in High Energy Physics

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Gianluca Traversi, Luigi Gaioni, Lodovico Ratti, Valerio Re and Elisa Riceputi Characterization of a 28 nm CMOS Technology for Analog Applic...
Mar 19, 2024

[Habilitation] Assessment of novel devices in CMOS technology

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Assessment of novel devices in CMOS technology by electrical characterization and physics-based model Habilitation Presented To Obtain The A...
Jan 8, 2024

[paper] Polylogarithms in MOSFET Modeling

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A. Ortiz-Conde and F. J. García-Sánchez Recent Applications of Polylogarithms in MOSFET Modeling 2023 IEEE 33rd International Conference on ...
Nov 13, 2023

[paper] PSP RF Model

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Xiaonian Liu 1, 2 and Yansen Liu 1 A Scalable PSP RF Model for 0.11 µm MOSFETs Progress In Electromagnetics Research Letters, Vol. 113, ...
Oct 6, 2023

[book chapters] Equation-Based Compact Modeling

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  Debnath, P., Sarkar, B., & Chanda, M. (Eds.). (2023). Differential Equation Based Solutions  for Emerging Real-Time Problems (1st ed.)...
Jun 13, 2023

[paper] FDSOI Threshold Voltage Model

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Hung-Chi Han1, (Student, IEEE), Zhixing Zhao2, Steffen Lehmann2, Edoardo Charbon1, (Fellow, IEEE), and Christian Enz1 (Life Fellow, IEEE) No...
Mar 15, 2023

[paper] Noise Characterization of MOSFETs for Cryogenic Electronics

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Variable-Temperature Broadband Noise Characterization of MOSFETs for Cryogenic Electronics: From Room Temperature down to 3K Kenji Ohmori 1...

[paper] highly segmented hybrid pixel detectors

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R. Ballabriga a , J.A. Alozy a , F.N. Bandi a , G. Blaj b , M. Campbell a , P. Christodoulou a c d , V. Coco a , A. Dorda a e , S. Emiliani...
Mar 8, 2023

[paper] Cryogenic Characteristics of InGaAs MOSFET

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L. Södergren, P. Olausson and E. Lind Cryogenic Characteristics of InGaAs MOSFET in IEEE TED, vol. 70, no. 3, pp. 1226-1230, March 2023, DOI...
Apr 26, 2022

[paper] 50 Two-Transistor MOSFET Circuits

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Harald Pretl* and Matthias Eberlein** Fifty Nifty Variations of Two-Transistor Circuits: A tribute to the versatility of MOSFETs IEEE Soli...

[paper] DL Physics-Driven MOSFET Modeling

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Ming-Yen Kao, H. Kam, and Chenming Hu, Life Fellow, IEEE Deep-Learning-Assisted Physics-Driven MOSFET Current-Voltage Modeling in IEEE Elect...
Apr 11, 2022

[paper] Noise Degradation and Recovery in Gamma-irradiated SOI nMOSFET

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S.Amora b , V.Kilchytska a , F.Tounsi a , N.André a , M.Machhout b , L.A.Francis a , D.Flandre a Characteristics of noise degradation and re...
Mar 18, 2022

[paper] Electron Mobility Distribution in FD-SOI MOSFETs

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Nima Dehdashti Akhavan a , Gilberto Antonio Umana-Membreno a , Renjie Gu a , Jarek Antoszewski a , Lorenzo Faraone a and Sorin Cristolovean...
Mar 3, 2022

[paper] Charge Trapping/Detrapping in Scaled MOSFETs

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Ruben Asanovski, Pierpaolo Palestri*, and Luca Selmi Importance of Charge Trapping/Detrapping Involving the Gate Electrode on the Noise Curr...
Feb 2, 2022

[paper] Modeling of SIC VDMOS FET

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Anirban Kar∗, Ahtisham Pampori∗, Noriyoshi Hashimoto† and Yogesh Singh Chauhan∗ A Charge-Based Silicon Carbide MOSFET Compact Model for Powe...
Jan 12, 2022

[paper] Compact Modelling of Si Nanowire/Nanosheet MOSFETs

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A. Cerdeira 1 , M. Estrada 1 , and M. A. Pavanello 2 On the compact modelling of Si nanowire and Si nanosheet MOSFETs Semiconductor Science ...
Jan 6, 2022

[paper] RTN of a 28-nm Cryogenic MOSFET

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HeeBong Yang, Marcel Robitaille, Xuesong Chen, Hazem Elgabra, Lan Wei, Na Young Kim Random Telegraph Noise of a 28-nm Cryogenic MOSFET in th...