Showing posts with label
low frequency noise
.
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Showing posts with label
low frequency noise
.
Show all posts
Mar 3, 2022
[paper] Charge Trapping/Detrapping in Scaled MOSFETs
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Ruben Asanovski, Pierpaolo Palestri*, and Luca Selmi Importance of Charge Trapping/Detrapping Involving the Gate Electrode on the Noise Curr...
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