Showing posts with label
interface traps
.
Show all posts
Showing posts with label
interface traps
.
Show all posts
Aug 30, 2021
Generalized EKV Compact MOSFET Model
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On the Explicit Saturation Drain Current in the Generalized EKV Compact MOSFET Model Francisco J. García-Sánchez, Life Senior Member, IEEE, ...
Nov 20, 2020
[paper] Characterization of ultrathin FDSOI devices using subthreshold slope method
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Teimuraz Mchedlidze 1 , and Elke Erben 2 Characterization of ultrathin FDSOI devices using subthreshold slope method Phys. Status Solidi A. ...
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