Showing posts with label
ekv
.
Show all posts
Showing posts with label
ekv
.
Show all posts
Apr 15, 2024
[course] MEAD @ EPFL
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Low-Power Analog Circuit Design Live Course @ EPFL, Lausanne, Switzerland JUNE 17-21, 2024 Registration Deadline: May 17, 2024 >> REGI...
Nov 29, 2023
[paper] Noise modeling for cryogenic applications
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Giovani Britton 1,2 , Salvador Mir 2 , Estelle Lauga-Larroze 2 , Benjamin Dormieu 1 , Quentin Berlingard 3,4 , Mickael Casse 3 and Philipp...
Mar 15, 2023
[paper] highly segmented hybrid pixel detectors
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R. Ballabriga a , J.A. Alozy a , F.N. Bandi a , G. Blaj b , M. Campbell a , P. Christodoulou a c d , V. Coco a , A. Dorda a e , S. Emiliani...
May 13, 2022
[Presentation] reached 200 reads on RG
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Yogesh S. Chauhan; Muhammed Karim (Rumi); Sriram V.; Sourabh Khandelwal; Ali Niknejad; Chenming Hu; Weimin Wu; Krishnanshu Dandu; Keith Gr...
Oct 26, 2021
conference paper reached 400 reads
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Bucher, M., J-M. Sallese, F. Krummenacher, D. Kazazis, C. Lallement, W. Grabinski, and C. Enz EKV 3.0: An analog design-oriented MOS trans...
Oct 21, 2021
[paper] Charge-based Modeling of FETs
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Jean-Michel Sallese Charge-based modeling of field effect transistors, Make it easy Joint International EUROSOI and EuroSOI-ULIS Workshop (...
Sep 17, 2021
[paper] EKV Model for Bulk-Driven Circuit Design Using gmb/ID Method
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Lukas Nagy, Daniel Arbet, Martin Kovac, Miroslav Potocny, Robert Ondica and Viera Stopjakova EKV Model for Bulk-Driven Circuit Design Using ...
Aug 30, 2021
Generalized EKV Compact MOSFET Model
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On the Explicit Saturation Drain Current in the Generalized EKV Compact MOSFET Model Francisco J. García-Sánchez, Life Senior Member, IEEE, ...
Apr 19, 2021
[paper] Deep-Learning Assisted Compact Modeling
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Hei Kam Deep-Learning Assisted Compact Modeling of Nanoscale Transistor CS230 Deep Learning; Stanford University (2021) Abstract - Transisto...
Jan 7, 2021
[paper] Generalized EKV Charge-based MOSFET Model
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A Generalized EKV Charge-based MOSFET Model Including Oxide and Interface Traps Chun-Min Zhang a , Farzan Jazaeri a , Giulio Borghello b ,...
Sep 9, 2020
[paper] Analogue 2D Semiconductor Electronics
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Analogue two-dimensional semiconductor electronics Dmitry K. Polyushkin 1 , Stefan Wachter 1 , Lukas Mennel 1 , Matthias Paur 1 , Maksym Pal...
May 18, 2020
[paper] Novel Design and Optimization and the gm/ID Ratio
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A Novel Design and Optimization Approach for Low Noise Amplifiers (LNA) Based on MOST Scattering Parameters and the gm/ID Ratio Juan L. C...
Feb 8, 2018
BSIM3v3 to EKV2.6 Model Parameter Extraction
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BSIM3v3 to EKV2.6 Model Parameter Extraction and Optimisation using LM Algorithm on 0.18um Technology node Kirmender Singh and Piyush J...
Oct 24, 2017
Cryogenic characterization of CMOS technologies
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A. Beckers, F. Jazaeri, A. Ruffino, C. Bruschini, A. Baschirotto and C. Enz Cryogenic characterization of 28 nm bulk CMOS technology for ...
Sep 12, 2017
[book] Systematic Design of Analog CMOS Circuits
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Paul G. A. Jespers, Boris Murmann Cambridge University Press; 31 Oct 2017; 342pp Discover a fresh approach to efficient and insight-d...
Aug 28, 2017
[paper] Nanoscale MOSFET Modeling
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Nanoscale MOSFET Modeling: Part 1: The Simplified EKV Model for the Design of Low-Power Analog Circuits C. Enz, F. Chicco and A. Pezz...
Jul 4, 2017
[paper] A Compact Model for the Statistics of the Low-Frequency Noise of MOSFETs With Laterally Uniform Doping
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A Compact Model for the Statistics of the Low-Frequency Noise of MOSFETs With Laterally Uniform Doping M. Banaszeski da Silva; H. P. Tuin...
Feb 28, 2017
[paper] Readout electronics for LGAD sensors
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Readout electronics for LGAD sensors O. Alonso, a N. Franch, a J. Canals, a F. Palacio, a M. López, a A. Vilà, a A. Diéguez, a M. ...
Feb 21, 2017
[paper] Bipolar and MOS Transistors Under the Effect of Radiation
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Measurements of the Electrical Characteristics of Bipolar and MOS Transistors Under the Effect of Radiation K. O. Petrosyants, L. M. Sa...
Feb 9, 2017
[Book] Low-power HF Microelectronics: a unified approach
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Low-power HF Microelectronics: a unified approach ISBN: 9780852968741 e-ISBN: 9781849193610 Editor: Gerson A. S. Machado Department ...
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