Showing posts with label
damage
.
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Showing posts with label
damage
.
Show all posts
Apr 3, 2024
[Overview] Radiation Damage Effects in Microelectronic Devices
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Yanru Ren1, Min Zhu 1 , Dongyu Xu 1,2 , Minghui Liu 1 , Xuehui Dai 1 , Shengao Wang1, and Longxian Li 1 Overview on Radiation Damage Effects...
Mar 28, 2024
[paper] Characteristics and ultra-high total ionizing dose response
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Termo, Gennaro, Giulio Borghello, Federico Faccio, Kostas Kloukinas, Michele Caselle, Alexander Friedrich Elsenhans, Ahmet Cagri Ulusoy, Adi...
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