Showing posts with label
Test-Structures
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Showing posts with label
Test-Structures
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Sep 27, 2018
[paper] Importance of complete characterization setup on onwafer TRL calibration in sub-THz range
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Chandan Yadav, Marina Deng, Magali De Matos, Sebastien Fregonese and Thomas Zimmer IMS Laboratory, University of Bordeaux 351 cours ...
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