Showing posts with label 1/f noise. Show all posts
Showing posts with label 1/f noise. Show all posts
Apr 3, 2024

[paper] CMOS Technology for Analog Applications in High Energy Physics

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Gianluca Traversi, Luigi Gaioni, Lodovico Ratti, Valerio Re and Elisa Riceputi Characterization of a 28 nm CMOS Technology for Analog Applic...
Mar 15, 2023

[paper] Noise Characterization of MOSFETs for Cryogenic Electronics

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Variable-Temperature Broadband Noise Characterization of MOSFETs for Cryogenic Electronics: From Room Temperature down to 3K Kenji Ohmori 1...
Mar 3, 2022

[paper] Charge Trapping/Detrapping in Scaled MOSFETs

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Ruben Asanovski, Pierpaolo Palestri*, and Luca Selmi Importance of Charge Trapping/Detrapping Involving the Gate Electrode on the Noise Curr...
Feb 22, 2022

[book] The Random and Fluctuating World

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The Random and Fluctuating World Celebrating Two Decades of Fluctuation and Noise Letters February 2022 Pages: 640 Edited By:  P V E McCli...
Feb 23, 2021

[papers] Compact/SPICE Modeling

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[1] Wang, Jie; Chen, Zhanfei; You, Shuzhen; Bakeroot, Benoit; Liu, Jun; Decoutere, Stefaan; " Surface-Potential-Based Compact Modeling ...
Jul 22, 2020

[paper] LF Noise Characterization of Ge n-Channel FinFETs

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Alberto V. de Oliveira (Member, IEEE), Duan Xie (Member, IEEE), Hiroaki Arimura, Guillaume Boccardi, Nadine Collaert, Cor Claeys (Fellow, I...
Nov 11, 2016

ICNF 2017: 2nd Call for Papers

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24th International Conference on Noise and Fluctuations (ICNF 2017)  20-23 of June 2017 in Vilnius, Lithuania We would like to invite y...
Oct 25, 2016

[ESSDERC Paper] Compact model for variability of low frequency noise due to number fluctuation effect

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Compact model for variability of low frequency noise due to number fluctuation effect N. Mavredakis and M. Bucher 2016 46th European So...
May 25, 2016

[Summer Tutorial] Verified Measurements for Successful Device Models

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 Verified Measurements for Successful Device Models   at IHP in Frankfurt (Oder), June 15-17, 2016  Good electronic device modeling re...