Showing posts with label
worst-case bias condition
.
Show all posts
Showing posts with label
worst-case bias condition
.
Show all posts
Jun 2, 2020
[paper] TID Effects in SOI FinFETs
›
Bias and geometry dependence of total-ionizing-dose effects in SOI FinFETs Zhexuan Ren 1 , Xia An 1 , Gensong Li 1 , Runsheng Wang 1 , Nu...
›
Home
View web version
