Showing posts with label variability. Show all posts
Showing posts with label variability. Show all posts
Jun 11, 2021

[paper] SPICE Modeling of Cycle-to-Cycle Variability in RRAM Devices

›
E.Salvador a , M.B.Gonzalez b , F.Campabadal b , J.Martin-Martinez a , R.Rodriguez a , E.Miranda a SPICE Modeling of Cycle-to-Cycle Variabil...
Jan 5, 2021

[paper] NESS Open-Source TCAD Environment

›
Cristina Medina-Bailon, Tapas Dutta, Fikru Adamu-Lema, Ali Rezaei, Daniel Nagy, Vihar P. Georgiev, and Asen Asenov Nano-Electronic Simulatio...
Oct 6, 2020

[paper] oTFT Charge-Based Variability Model

›
Aristeidis Nikolaou, Ghader Darbandy, Jakob Leise, Jakob Pruefer, James W. Borchert, Michael Geiger, Hagen Klauk, Benjamin Iñiguez, Fellow, ...
Jun 8, 2020

[paper] NESS

›
Nano-electronic Simulation Software (NESS):  a flexible nano-device simulation platform Salim Berrada, Hamilton Carrillo-Nunez, Jaehyu...
Jul 26, 2017

[paper] A Compact Model for the Statistics of the Low-Frequency Noise of MOSFETs With Laterally Uniform Doping

›
M. Banaszeski da Silva, H. P. Tuinhout, A. Zegers-van Duijnhoven, G. I. Wirth and A. J. Scholten "A Compact Model for the Statistics...
Jul 4, 2017

[paper] A Compact Model for the Statistics of the Low-Frequency Noise of MOSFETs With Laterally Uniform Doping

›
A Compact Model for the Statistics of the Low-Frequency Noise of MOSFETs With Laterally Uniform Doping M. Banaszeski da Silva; H. P. Tuin...
Oct 25, 2016

[ESSDERC Paper] Compact model for variability of low frequency noise due to number fluctuation effect

›
Compact model for variability of low frequency noise due to number fluctuation effect N. Mavredakis and M. Bucher 2016 46th European So...