Showing posts with label
total ionizing dose
.
Show all posts
Showing posts with label
total ionizing dose
.
Show all posts
Apr 25, 2022
[paper] DC, LF noise and TID mechanisms in 16nm FinFETs
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Stefano Bonaldo ab , Teng Ma ab , Serena Mattiazzo bc , Andrea Baschirotto de , Christian Enz f , Daniel M.Fleetwood g , Alessandro Paccagne...
Apr 11, 2022
[paper] Noise Degradation and Recovery in Gamma-irradiated SOI nMOSFET
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S.Amora b , V.Kilchytska a , F.Tounsi a , N.André a , M.Machhout b , L.A.Francis a , D.Flandre a Characteristics of noise degradation and re...
Dec 19, 2018
Compact Transistor Modeling with Radiation Effects
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A Radiation-Hardened Instrumentation Amplifier for Sensor Readout Integrated Circuits in Nuclear Fusion Applications Kyungsoo Jeong 1, ...
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