Showing posts with label
scattering
.
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Showing posts with label
scattering
.
Show all posts
Mar 8, 2023
[paper] Cryogenic Characteristics of InGaAs MOSFET
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L. Södergren, P. Olausson and E. Lind Cryogenic Characteristics of InGaAs MOSFET in IEEE TED, vol. 70, no. 3, pp. 1226-1230, March 2023, DOI...
Mar 18, 2022
[paper] Electron Mobility Distribution in FD-SOI MOSFETs
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Nima Dehdashti Akhavan a , Gilberto Antonio Umana-Membreno a , Renjie Gu a , Jarek Antoszewski a , Lorenzo Faraone a and Sorin Cristolovean...
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