Showing posts with label
on-wafer RF characterization
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Showing posts with label
on-wafer RF characterization
.
Show all posts
Jul 25, 2017
[paper] Compact On-Wafer Test Structures for Device RF Characterization
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B. Kazemi Esfeh, K. Ben Ali and J. P. Raskin IEEE Fellow Compact On-Wafer Test Structures for Device RF Characterization in IEEE TED, v...
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