Showing posts with label
gate leakage
.
Show all posts
Showing posts with label
gate leakage
.
Show all posts
Apr 3, 2024
[paper] CMOS Technology for Analog Applications in High Energy Physics
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Gianluca Traversi, Luigi Gaioni, Lodovico Ratti, Valerio Re and Elisa Riceputi Characterization of a 28 nm CMOS Technology for Analog Applic...
Oct 6, 2021
[paper] Gate Tunneling Current in MFIS NCFETs
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Kshitiz Tyagi, Amit Verma, and Aloke K. Dutta Modeling of the Gate Tunneling Current in MFIS NCFETs IEEE Transactions on Electron Devices, p...
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