Showing posts with label
electron and hole trappings
.
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Showing posts with label
electron and hole trappings
.
Show all posts
Jun 24, 2020
[paper] Hot Carrier Degradation in n-MOSFETs
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S. Mahapatra and U. Sharma, Department of Electrical Engineering, IIT Bombay, Mumbai 400076, India A Review of Hot Carrier Degradati...
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