Showing posts with label
degradations
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Showing posts with label
degradations
.
Show all posts
Sep 27, 2021
[paper] Degradations in LDMOS Transistors
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Yen-Pu Chen 1 , Bikram K. Mahajan 1 , Dhanoop Varghese 2 , Srikanth Krishnan 2 , Vijay Reddy 2 and Muhammad A. Alam 1 T hree-point I–V spect...
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