Showing posts with label
channel-length
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Showing posts with label
channel-length
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Jan 5, 2021
[paper] Aged MOSFET and Its Compact Modeling
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F. A. Herrera, M. Miura-Mattausch, T. Iizuka, H. Kikuchihara, H. J. Mattausch and H. Takatsuka, Universal Feature of Trap-Density Increase i...
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