Showing posts with label
bulk MOSFETsRadiation damageTotal ionizing dose
.
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Showing posts with label
bulk MOSFETsRadiation damageTotal ionizing dose
.
Show all posts
Jan 7, 2021
[paper] Generalized EKV Charge-based MOSFET Model
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A Generalized EKV Charge-based MOSFET Model Including Oxide and Interface Traps Chun-Min Zhang a , Farzan Jazaeri a , Giulio Borghello b ,...
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