Showing posts with label
Test Beam
.
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Showing posts with label
Test Beam
.
Show all posts
May 14, 2024
[paper] CMOS strip sensors
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Naomi Davis a, Jan-Hendrik Arling a, Marta Baselga d, Leena Diehl b f, Jochen Dingfelder c, Ingrid-Maria Gregor a, Marc Hauser b, Fabian Hüg...
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