Showing posts with label
TID
.
Show all posts
Showing posts with label
TID
.
Show all posts
Apr 11, 2022
[paper] Noise Degradation and Recovery in Gamma-irradiated SOI nMOSFET
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S.Amora b , V.Kilchytska a , F.Tounsi a , N.André a , M.Machhout b , L.A.Francis a , D.Flandre a Characteristics of noise degradation and re...
Jun 2, 2020
[paper] TID Effects in SOI FinFETs
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Bias and geometry dependence of total-ionizing-dose effects in SOI FinFETs Zhexuan Ren 1 , Xia An 1 , Gensong Li 1 , Runsheng Wang 1 , Nu...
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