Showing posts with label
Substrates
.
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Showing posts with label
Substrates
.
Show all posts
Apr 3, 2024
[paper] CMOS Technology for Analog Applications in High Energy Physics
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Gianluca Traversi, Luigi Gaioni, Lodovico Ratti, Valerio Re and Elisa Riceputi Characterization of a 28 nm CMOS Technology for Analog Applic...
Jul 25, 2017
[paper] Compact On-Wafer Test Structures for Device RF Characterization
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B. Kazemi Esfeh, K. Ben Ali and J. P. Raskin IEEE Fellow Compact On-Wafer Test Structures for Device RF Characterization in IEEE TED, v...
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