Showing posts with label
Semiconductor process modeling
.
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Showing posts with label
Semiconductor process modeling
.
Show all posts
Jul 4, 2017
[paper] A Compact Model for the Statistics of the Low-Frequency Noise of MOSFETs With Laterally Uniform Doping
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A Compact Model for the Statistics of the Low-Frequency Noise of MOSFETs With Laterally Uniform Doping M. Banaszeski da Silva; H. P. Tuin...
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