Assessment of novel devices in CMOS technology by electrical characterization and physics-based model Habilitation Presented To Obtain The A...

JART VCM v1 Verilog-A Compact Model User Guide Christopher Bengel, David Kaihua Zhang, Rainer Waser, Stephan Menzel Electronic Materials Res...

IEEE EDS France, IRDS and the SINANO Institute will organize a Webinar  " More Moore Roadmap " by Mustafa Badaroglu  IRDS-IFT More...