Showing posts with label RTN. Show all posts
Showing posts with label RTN. Show all posts
Jan 6, 2022

[paper] RTN of a 28-nm Cryogenic MOSFET

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HeeBong Yang, Marcel Robitaille, Xuesong Chen, Hazem Elgabra, Lan Wei, Na Young Kim Random Telegraph Noise of a 28-nm Cryogenic MOSFET in th...
Jun 28, 2021

[paper] RTN and BTI statistical compact modeling

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G.Pedreira a , J.Martin-Martinez a , P.Saraza-Canflanca b , R.Castro Lopez b , R.Rodriguez a , E.Roca b , F.V.Fernandez b , M.Nafria a   Uni...
Jun 7, 2021

[paper] JART VCM v1 Verilog-A Compact

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JART VCM v1 Verilog-A Compact Model User Guide Christopher Bengel, David Kaihua Zhang, Rainer Waser, Stephan Menzel Electronic Materials Res...
Aug 1, 2017

[paper] Circuit-level simulation methodology for Random Telegraph Noise by using Verilog-AMS

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T. Komawaki, M. Yabuuchi, R. Kishida, J. Furuta, T. Matsumoto and K. Kobayashi Circuit-level simulation methodology for Random Telegraph ...
Jul 26, 2017

[paper] A Compact Model for the Statistics of the Low-Frequency Noise of MOSFETs With Laterally Uniform Doping

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M. Banaszeski da Silva, H. P. Tuinhout, A. Zegers-van Duijnhoven, G. I. Wirth and A. J. Scholten "A Compact Model for the Statistics...
Jul 4, 2017

[paper] A Compact Model for the Statistics of the Low-Frequency Noise of MOSFETs With Laterally Uniform Doping

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A Compact Model for the Statistics of the Low-Frequency Noise of MOSFETs With Laterally Uniform Doping M. Banaszeski da Silva; H. P. Tuin...