Showing posts with label
Oxide-trapped charges
.
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Showing posts with label
Oxide-trapped charges
.
Show all posts
Aug 30, 2021
Generalized EKV Compact MOSFET Model
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On the Explicit Saturation Drain Current in the Generalized EKV Compact MOSFET Model Francisco J. García-Sánchez, Life Senior Member, IEEE, ...
Jan 7, 2021
[paper] Generalized EKV Charge-based MOSFET Model
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A Generalized EKV Charge-based MOSFET Model Including Oxide and Interface Traps Chun-Min Zhang a , Farzan Jazaeri a , Giulio Borghello b ,...
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