Showing posts with label
Negative bias temperature instability
.
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Showing posts with label
Negative bias temperature instability
.
Show all posts
Sep 22, 2021
[paper] Abstraction NBTI model
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Stephan Adolf and Wolfgang Nebel Abstraction NBTI model it - Information Technology, Sep. 2021 DOI: 10.1515/itit-2021-0005 Abstract : Negati...
Feb 7, 2017
[paper] Statistical model of the NBTI-induced ΔVth, ΔSS, and Δgm degradations in advanced pFinFETs
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Statistical model of the NBTI induced threshold voltage, subthreshold swing, and transconductance degradations in advanced pFinFETs J. Fra...
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