Showing posts with label
In-Situ Thermal Annealing
.
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Showing posts with label
In-Situ Thermal Annealing
.
Show all posts
Apr 11, 2022
[paper] Noise Degradation and Recovery in Gamma-irradiated SOI nMOSFET
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S.Amora b , V.Kilchytska a , F.Tounsi a , N.André a , M.Machhout b , L.A.Francis a , D.Flandre a Characteristics of noise degradation and re...
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