Showing posts with label FinFET; single event upset; static random-access memory; process fluctuation; process corner. Show all posts
Showing posts with label FinFET; single event upset; static random-access memory; process fluctuation; process corner. Show all posts
Dec 21, 2025

[paper] Single Event Upset in FINFET SRAM

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SUN Qian¹²,, GUO Yang¹²*,, LIANG Bin¹², CHI Yaqing¹², TAO Ming³, LUO Deng¹², CHEN Jianjun¹², SUN Hanhan2, HU Chunmei¹2, FANG Yahao¹2, GAO Yu...