Showing posts with label
FEM
.
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Showing posts with label
FEM
.
Show all posts
Apr 29, 2021
[PhD] VLSI Interconnect Reliability
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Shaoyi Peng Modeling and Simulation Methods for VLSI Interconnect Reliability Focusing on Time Dependent Dielectric Breakdown PhD Dissertat...
May 5, 2020
[paper] Memory Technology – A Primer for Material Scientists.
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Schenk, Tony, Milan Pesic, Stefan Slesazeck, Uwe Schroeder, and Thomas Mikolajick Memory Technology–A Primer for Material Scientists Re...
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