Showing posts with label
Electron traps
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Showing posts with label
Electron traps
.
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Mar 8, 2023
[paper] Cryogenic Characteristics of InGaAs MOSFET
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L. Södergren, P. Olausson and E. Lind Cryogenic Characteristics of InGaAs MOSFET in IEEE TED, vol. 70, no. 3, pp. 1226-1230, March 2023, DOI...
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