Showing posts with label
Direct oxide tunneling
.
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Showing posts with label
Direct oxide tunneling
.
Show all posts
Aug 21, 2025
[paper] Geometrical variability in FinFETs
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C. Medina-Bailon, J.L. Padilla, L. Donetti, C. Navarro, C. Sampedro, F. Gamiz, Geometrical variability impact on the gate tunneling leakage ...
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