Showing posts with label
Degradation
.
Show all posts
Showing posts with label
Degradation
.
Show all posts
Feb 7, 2017
[paper] Statistical model of the NBTI-induced ΔVth, ΔSS, and Δgm degradations in advanced pFinFETs
›
Statistical model of the NBTI induced threshold voltage, subthreshold swing, and transconductance degradations in advanced pFinFETs J. Fra...
›
Home
View web version
