Showing posts with label
Degradation
.
Show all posts
Showing posts with label
Degradation
.
Show all posts
Oct 13, 2026
[paper] Self-Heating Effects in 55-nm SiGe HBTs
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Abdelaaziz Boulgheb1, Billel Smaani2, Taha Housseyn Nouibat1 Physics-Based Electro-Thermal Modeling and Analysis of Self-Heating Effects in...
Feb 7, 2017
[paper] Statistical model of the NBTI-induced ΔVth, ΔSS, and Δgm degradations in advanced pFinFETs
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Statistical model of the NBTI induced threshold voltage, subthreshold swing, and transconductance degradations in advanced pFinFETs J. Fra...
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