Showing posts with label
Defects
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Showing posts with label
Defects
.
Show all posts
Jun 28, 2021
[paper] RTN and BTI statistical compact modeling
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G.Pedreira a , J.Martin-Martinez a , P.Saraza-Canflanca b , R.Castro Lopez b , R.Rodriguez a , E.Roca b , F.V.Fernandez b , M.Nafria a Uni...
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