Showing posts with label
Compact Noise Model
.
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Showing posts with label
Compact Noise Model
.
Show all posts
Nov 23, 2020
[paper] Noise Modeling of Gate Leakage Current in Nanoscale MOSFETs
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Jonghwan Lee* Noise Modeling of Gate Leakage Current in Nanoscale MOSFETs Journal of the Semiconductor & Display Technology, Vol. 19, ...
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